1. Enter the baseline rate
Use the current feature-store pass, freshness, retrieval, or other binary success rate.
2. Define the minimum lift
Enter the smallest absolute percentage-point increase that would matter operationally.
3. Set samples per group
Use the planned number of independent observations in both the baseline and comparison groups.
4. Choose significance
Select the Type I error threshold used by your two-sided test.
5. Review power
Higher power means the planned test is more likely to detect the stated lift if that lift is real.